Gupta SN, Singh A, Pal K, Muthu DVS, Shekhar C, Qi Y, Naumov PG, Medvedev SA, Felser C, Waghmare UV, Sood AK (2018)
Publication Type: Journal article
Publication year: 2018
Book Volume: 97
Article Number: 064102
Journal Issue: 6
DOI: 10.1103/PhysRevB.97.064102
We report high-pressure Raman, synchrotron x-ray diffraction, and electrical transport studies on Weyl semimetals NbP and TaP along with first-principles density functional theoretical (DFT) analysis. The frequencies of first-order Raman modes of NbP harden with increasing pressure and exhibit a slope change at Pc∼9 GPa. The pressure-dependent resistivity exhibits a minimum at Pc. The temperature coefficient of resistivity below Pc is positive as expected for semimetals but changes significantly in the high-pressure phase. Using DFT calculations, we show that these anomalies are associated with a pressure-induced Lifshitz transition, which involves the appearance of electron and hole pockets in its electronic structure. In contrast, the results of Raman and synchrotron x-ray diffraction experiments on TaP and DFT calculations show that TaP is quite robust under pressure and does not undergo any phase transition.
APA:
Gupta, S.N., Singh, A., Pal, K., Muthu, D.V.S., Shekhar, C., Qi, Y.,... Sood, A.K. (2018). Pressure-induced Lifshitz transition in NbP: Raman, x-ray diffraction, electrical transport, and density functional theory. Physical Review B, 97(6). https://doi.org/10.1103/PhysRevB.97.064102
MLA:
Gupta, Satyendra Nath, et al. "Pressure-induced Lifshitz transition in NbP: Raman, x-ray diffraction, electrical transport, and density functional theory." Physical Review B 97.6 (2018).
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