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Thermal Memory Effect Characterization of GaN based Class ABJ Power Amplifier using Intrinsic Temperature Measurement

Jüschke P, Fischer G (2018)

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Publication Type: Conference contribution

Publication year: 2018

DOI: 10.1109/PAWR.2018.8310052

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How to cite

APA:

Jüschke, P., & Fischer, G. (2018). Thermal Memory Effect Characterization of GaN based Class ABJ Power Amplifier using Intrinsic Temperature Measurement. In Proceedings of the IEEE Topical Conference on RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR).

MLA:

Jüschke, Patrick, and Georg Fischer. "Thermal Memory Effect Characterization of GaN based Class ABJ Power Amplifier using Intrinsic Temperature Measurement." Proceedings of the IEEE Topical Conference on RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR) 2018.

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