Wendav T, Fischer IA, Montanari M, Zoellner MH, Klesse W, Capellini G, Von Den Driesch N, Oehme M, Buca D, Busch K, Schulze J (2016)
Publication Type: Journal article
Publication year: 2016
Book Volume: 108
Article Number: 242104
Journal Issue: 24
DOI: 10.1063/1.4953784
The group-IV semiconductor alloy Ge1- x - ySixSny has recently attracted great interest due to its prospective potential for use in optoelectronics, electronics, and photovoltaics. Here, we investigate molecular beam epitaxy grown Ge1- x - ySixSny alloys lattice-matched to Ge with large Si and Sn concentrations of up to 42% and 10%, respectively. The samples were characterized in detail by Rutherford backscattering/channeling spectroscopy for composition and crystal quality, x-ray diffraction for strain determination, and photoluminescence spectroscopy for the assessment of band-gap energies. Moreover, the experimentally extracted material parameters were used to determine the SiSn bowing and to make predictions about the optical transition energy.
APA:
Wendav, T., Fischer, I.A., Montanari, M., Zoellner, M.H., Klesse, W., Capellini, G.,... Schulze, J. (2016). Compositional dependence of the band-gap of Ge1-x-YSixSny alloys. Applied Physics Letters, 108(24). https://doi.org/10.1063/1.4953784
MLA:
Wendav, Torsten, et al. "Compositional dependence of the band-gap of Ge1-x-YSixSny alloys." Applied Physics Letters 108.24 (2016).
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