A monolithically integrated, optically clocked 10 GS/s sampler with a bandwidth of >30 GHz and a jitter of <30 fs in photonic SiGe BiCMOS technology

Krueger B, Makon RE, Landolt O, Hidri O, Schweiger T, Krune E, Knoll D, Lischke S, Schulze J (2017)


Publication Type: Conference contribution

Publication year: 2017

Journal

Publisher: Institute of Electrical and Electronics Engineers Inc.

Book Volume: 2017-April

Conference Proceedings Title: Proceedings of the Custom Integrated Circuits Conference

Event location: Austin, TX US

ISBN: 9781509051915

DOI: 10.1109/CICC.2017.7993673

Abstract

This paper presents an optically clocked 10 GS/s-sampler monolithically integrated in a photonic 0.25 μm SiGe-BiCMOS technology, which uses an ultra-stable optical pulse train generated by a hybrid mode-locked laser to sample an electrical signal. The integrated circuit includes optical waveguides, as well as a grating coupler, Germanium photodiodes with a bandwidth of >50 GHz, and an integrate-and-dump sampler. Experimental results demonstrate an analog bandwidth exceeding 30 GHz, a jitter of <30 fs, as well as a THD of <-33 dB over the entire bandwidth, and a SNR of 35.3 dB.

Involved external institutions

How to cite

APA:

Krueger, B., Makon, R.E., Landolt, O., Hidri, O., Schweiger, T., Krune, E.,... Schulze, J. (2017). A monolithically integrated, optically clocked 10 GS/s sampler with a bandwidth of >30 GHz and a jitter of <30 fs in photonic SiGe BiCMOS technology. In Proceedings of the Custom Integrated Circuits Conference. Austin, TX, US: Institute of Electrical and Electronics Engineers Inc..

MLA:

Krueger, B., et al. "A monolithically integrated, optically clocked 10 GS/s sampler with a bandwidth of >30 GHz and a jitter of <30 fs in photonic SiGe BiCMOS technology." Proceedings of the 38th Annual Custom Integrated Circuits Conference, CICC 2017, Austin, TX Institute of Electrical and Electronics Engineers Inc., 2017.

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