Investigating the effect of source contamination on eXTP/SFA

Zhang J, Li G, Ge M, Kirsch C, Lorenz M, Wilms J, Qi L, Sheng L, Yang YJ, Dauser T, Xu Y, Lu F, Yang Y, Wang Y, Chen Y (2020)

Publication Type: Conference contribution

Publication year: 2020

Journal

Proceedings of SPIE Society of Photo-optical Instrumentation Engineers (SPIE)

Publisher: SPIE

Book Volume: 11444

Conference Proceedings Title: Proceedings of SPIE - The International Society for Optical Engineering

ISBN: 9781510636750

DOI: 10.1117/12.2561944

Abstract

The Spectroscopy Focusing Array (SFA) onboard the enhanced X-ray Timing and Polarimetry (eXTP) observatory consists of 9 modules, each comprising a Wolter type I telescope with a field of view (FOV) around 16 arcminutes and a focal plane silicon drift detector (SDD) with 19 hexagonal pixels. Due to the large size of each individual SDD pixel (each pixel corresponds to an area of ∼ 3.6 arcminutes in diameter) and the limited pixel number, SFA can not obtain a real image of the observed region like many other X-ray imaging telescopes. Thus, contamination from nearby bright sources needs to be considered when we study the properties of the target source. We simulate such contaminations using the SIXTE simulator. In this paper we present the results by taking observations of the millisecond pulsar PSR J0437-4715 as an example, and discuss the cases for contamination on background or target source respectively.

Authors with CRIS profile

Christian Kirsch Dr.Karl-Remeis-Sternwarte Bamberg, Astronomisches Institut Maximilian Lorenz Dr.Karl-Remeis-Sternwarte Bamberg, Astronomisches Institut Jörn Wilms Professur für Astronomie und Astrophysik Thomas Dauser Dr.Karl-Remeis-Sternwarte Bamberg, Astronomisches Institut

Involved external institutions

Institute of High Energy Physics (IHEP) / 中国科学院高能物理研究所 CN China (CN) Xian Institute of Optics and Precision Mechanics (XIOPM) CN China (CN)

How to cite

APA:

Zhang, J., Li, G., Ge, M., Kirsch, C., Lorenz, M., Wilms, J.,... Chen, Y. (2020). Investigating the effect of source contamination on eXTP/SFA. In Jan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa (Eds.), Proceedings of SPIE - The International Society for Optical Engineering. SPIE.

MLA:

Zhang, Juan, et al. "Investigating the effect of source contamination on eXTP/SFA." Proceedings of the Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray Ed. Jan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa, SPIE, 2020.

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