Bräuer P, Wurzer L, Kuhn T, Knoeller A, Mueller H, Eberhardt W, Zimmermann A, Franke J (2020)
Publication Type: Conference contribution
Publication year: 2020
Publisher: IEEE
City/Town: NEW YORK
Conference Proceedings Title: 2020 43RD INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE)
DOI: 10.1109/isse49702.2020.9120883
APA:
Bräuer, P., Wurzer, L., Kuhn, T., Knoeller, A., Mueller, H., Eberhardt, W.,... Franke, J. (2020). Reliability of Mechatronic Integrated Devices Regarding Failure Mechanisms. In 2020 43RD INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE). NEW YORK: IEEE.
MLA:
Bräuer, Philipp, et al. "Reliability of Mechatronic Integrated Devices Regarding Failure Mechanisms." Proceedings of the 43rd International Spring Seminar on Electronics Technology (ISSE) NEW YORK: IEEE, 2020.
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