Peukert W, Segets D, Haderlein M, Pflug L, Leugering G, Gröschel M (2015)
Publication Language: English
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2015
Publisher: Elsevier Ltd
Book Volume: 102
Pages Range: 575-581
DOI: 10.1016/j.proeng.2015.01.129
APA:
Peukert, W., Segets, D., Haderlein, M., Pflug, L., Leugering, G., & Gröschel, M. (2015). From in situ characterization to process control of quantum dot systems. In Proceedings of the 7th World Congress on Particle Technology, WCPT 2014 (pp. 575-581). Bejing, CN: Elsevier Ltd.
MLA:
Peukert, Wolfgang, et al. "From in situ characterization to process control of quantum dot systems." Proceedings of the 7th World Congress on Particle Technology, WCPT 2014, Bejing Elsevier Ltd, 2015. 575-581.
BibTeX: Download