Peschel J, Knödtel J, Pérez E, Reichenbach M, Wenger C, Fey D (2019)
Publication Language: English
Publication Type: Conference contribution, Abstract of lecture
Publication year: 2019
Pages Range: 45
Event location: International Congress Center Dresden
APA:
Peschel, J., Knödtel, J., Pérez, E., Reichenbach, M., Wenger, C., & Fey, D. (2019). Optimizing Multi-State Reliability in ReRAM Arrays using an Automated Device Selection Method. Paper presentation at MEMRISYS 2019 International Conference on Memristive Materials, Devices & Systems, International Congress Center Dresden.
MLA:
Peschel, Jakob, et al. "Optimizing Multi-State Reliability in ReRAM Arrays using an Automated Device Selection Method." Presented at MEMRISYS 2019 International Conference on Memristive Materials, Devices & Systems, International Congress Center Dresden 2019.
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