Issakov V, Sene B, Aguilar Mendoza E, Werthof A, Jenei S, Weigel R (2017)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2017
Pages Range: 660-663
DOI: 10.23919/EuMC.2017.8230933
Direct characterization of differential components
requires multiport equipment, which is not always available.
Thus, it is a common practice to attach balanced-unbalanced
(balun) circuits to convert between single-ended and differential
signals. However, removing impact of baluns from measured
two-port S-parameters is a challenge, since baluns are threeport devices and classical de-embedding techniques are not
applicable. Additionally, obtaining the S-parameters of baluns
by two-port network analyzer is not trivial, since the ports at
the differential side are tightly coupled. In this paper we address
both challenges by proposing two techniques: how to characterize
a balun using two-port measurements, and how to accurately
de-embed the impact of balun characteristics from device-undertest (DUT) measurements. The applicability and accuracy of
the proposed techniques is analyzed. For verification, the first
technique has been applied to characterize an integrated ultrawideband (UWB) Marchand balun, and the second to de-embed
the baluns impact from measured results of the balun-DUTbalun structure. The characterized DUT is a differential LNA
operating in the range from 30 GHz to 110 GHz realized in
0.35 μm SiGe:C bipolar technology. The obtained de-embedded
S-parameters are compared with the directly measured results
APA:
Issakov, V., Sene, B., Aguilar Mendoza, E., Werthof, A., Jenei, S., & Weigel, R. (2017). Considerations on Accurate Characterization of Differential Devices Using Baluns. In Proceedings of the European Microwave Conference (pp. 660-663). Nürnberg, DE.
MLA:
Issakov, Vadim, et al. "Considerations on Accurate Characterization of Differential Devices Using Baluns." Proceedings of the European Microwave Conference, Nürnberg 2017. 660-663.
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