Häublein V, Frey L, Ryssel H, Walser H (2002)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2002
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 346-349
Article Number: 1258011
ISBN: 0780371550
APA:
Häublein, V., Frey, L., Ryssel, H., & Walser, H. (2002). Investigation of lanthanum contamination from a lanthanated tungsten ion source. In Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 (pp. 346-349). Institute of Electrical and Electronics Engineers Inc..
MLA:
Häublein, Volker, et al. "Investigation of lanthanum contamination from a lanthanated tungsten ion source." Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 Institute of Electrical and Electronics Engineers Inc., 2002. 346-349.
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