Biró L, Gyulai J, Havancsák K, Didyk A, Bogen S, Frey L, Ryssel H (1997)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 1997
Publisher: Elsevier
Book Volume: 122
Pages Range: 559-562
Journal Issue: 3
DOI: 10.1016/S0168-583X(96)00662-3
APA:
Biró, L., Gyulai, J., Havancsák, K., Didyk, A., Bogen, S., Frey, L., & Ryssel, H. (1997). New method based on atomic force microscopy for in-depth characterization of damage in Si irraadiate with 209 MeV Kr. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 122(3), 559-562. https://doi.org/10.1016/S0168-583X(96)00662-3
MLA:
Biró, L., et al. "New method based on atomic force microscopy for in-depth characterization of damage in Si irraadiate with 209 MeV Kr." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 122.3 (1997): 559-562.
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