Braeutigam B, Rizzoli P, Martone M, Bachmann M, Kraus T, Krieger G (2012)
Publication Type: Conference contribution
Publication year: 2012
Publisher: IEEE
Edited Volumes: International Geoscience and Remote Sensing Symposium (IGARSS)
Pages Range: 5570-5573
Conference Proceedings Title: IEEE International Geoscience and Remote Sensing Symposium (IGARSS)
URI: https://elib.dlr.de/75799/
DOI: 10.1109/IGARSS.2012.6352343
TanDEM-X is an interferometric SAR (InSAR) mission acquiring bistatic images with two satellites. Systematic mapping of the Earth's land masses will provide individual interferometric data sets which will be mosaicked and calibrated into a global Digital Elevation Model (DEM). The concept of InSAR and DEM quality monitoring throughout the acquisition and processing phase is presented in this paper. © 2012 IEEE.
APA:
Braeutigam, B., Rizzoli, P., Martone, M., Bachmann, M., Kraus, T., & Krieger, G. (2012). InSAR and DEM Quality Monitoring of TanDEM-X. In IEEE International Geoscience and Remote Sensing Symposium (IGARSS) (pp. 5570-5573). Munich, DE: IEEE.
MLA:
Braeutigam, Benjamin, et al. "InSAR and DEM Quality Monitoring of TanDEM-X." Proceedings of the 2012 32nd IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2012, Munich IEEE, 2012. 5570-5573.
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