TanDEM-X: A Single-Pass SAR Interferometer for global DEM Generation and Demonstration of new SAR Techniques
Zink M, Bachmann M, Brautigam B, Fritz T, Hajnsek I, Krieger G, Moreira A, Wessel B (2015)
Publication Type: Conference contribution
Publication year: 2015
Publisher: IEEE
Edited Volumes: International Geoscience and Remote Sensing Symposium (IGARSS)
Book Volume: 2015-November
Pages Range: 1-4
Conference Proceedings Title: IEEE International Geoscience and Remote Sensing Symposium (IGARSS)
ISBN: 9781479979295
URI: https://elib.dlr.de/98030/
DOI: 10.1109/IGARSS.2015.7326418
Abstract
TanDEM-X (TerraSAR-X add-on for Digital Elevation Measurements) is an Earth observation radar mission that consists of a SAR interferometer built by two almost identical satellites flying in close formation [1]-[4]. With a typical separation between the satellites of 120 to 500 m a global Digital Elevation Model (DEM) with 2 m relative height accuracy at 12 m posting is being generated. While the main mission phase for DEM data acquisition has been finished in 2014, the processing of the global TanDEM-X DEM will be concluded mid-2016. Final DEMs for more than 65% of all land masses are already available for scientific and commercial applications. A 15-month science phase of the TanDEM-X mission started in October 2014 which offers the opportunity to explore the generation of DEMs with even higher accuracy for selected areas, and to demonstrate the capabilities of this unique mission for new scientific applications.
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Germany (DE)How to cite
APA:
Zink, M., Bachmann, M., Brautigam, B., Fritz, T., Hajnsek, I., Krieger, G.,... Wessel, B. (2015). TanDEM-X: A Single-Pass SAR Interferometer for global DEM Generation and Demonstration of new SAR Techniques. In IEEE International Geoscience and Remote Sensing Symposium (IGARSS) (pp. 1-4). IEEE.
MLA:
Zink, Manfred, et al. "TanDEM-X: A Single-Pass SAR Interferometer for global DEM Generation and Demonstration of new SAR Techniques." Proceedings of the IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 IEEE, 2015. 1-4.
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