Siegl S, Hielscher KS, German R (2010)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2010
Pages Range: 110-115
Article Number: 5550938
Event location: Qingdao
ISBN: 9781424471249
DOI: 10.1109/ICVES.2010.5550938
APA:
Siegl, S., Hielscher, K.-S., & German, R. (2010). Model driven testing of embedded automotive systems with timed usage models. In Proceedings of the 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010 (pp. 110-115). Qingdao.
MLA:
Siegl, Sebastian, Kai-Steffen Hielscher, and Reinhard German. "Model driven testing of embedded automotive systems with timed usage models." Proceedings of the 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010, Qingdao 2010. 110-115.
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