Deformation Strength of Nanocrystalline Thin Films
Blum W, Eisenlohr P (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Journal
Publisher: JOURNAL MATER SCI TECHNOL
Book Volume: 33
Pages Range: 718-722
Journal Issue: 7
DOI: 10.1016/j.jmst.2016.11.025
Abstract
The data of deformation strength and microstructure of thin films of nanocrystalline Pd recently provided by Colla et al. have been analysed. It is shown that the properties of the films with cylindrical grains of 30nm diameter extending over a significant portion of the film thickness (approximate to 90 nm) are quantitatively comparable to what is known from nanocrystalline bulk material. This is explained in terms of boundarymediated processes governing emission, storage, and recovery of dislocations. (C) 2017 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
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APA:
Blum, W., & Eisenlohr, P. (2017). Deformation Strength of Nanocrystalline Thin Films. Journal of Materials Science & Technology, 33(7), 718-722. https://doi.org/10.1016/j.jmst.2016.11.025
MLA:
Blum, Wolfgang, and Philip Eisenlohr. "Deformation Strength of Nanocrystalline Thin Films." Journal of Materials Science & Technology 33.7 (2017): 718-722.
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