A permutation test to analyse systematic bias and random measurement errors of medical devices via boosting location and scale models

Mayr A, Schmid M, Pfahlberg AB, Uter W, Gefeller O (2017)

Publication Type: Journal article

Publication year: 2017

Journal

Statistical Methods in Medical Research SAGE Publications (UK and US)

Book Volume: 26

Pages Range: 1443-1460

Journal Issue: 3

DOI: 10.1177/0962280215581855

Abstract

Measurement errors of medico-technical devices can be separated into systematic bias and random error. We propose a new method to address both simultaneously via generalized additive models for location, scale and shape (GAMLSS) in combination with permutation tests. More precisely, we extend a recently proposed boosting algorithm for GAMLSS to provide a test procedure to analyse potential device effects on the measurements. We carried out a large-scale simulation study to provide empirical evidence that our method is able to identify possible sources of systematic bias as well as random error under different conditions. Finally, we apply our approach to compare measurements of skin pigmentation from two different devices in an epidemiological study.

Authors with CRIS profile

Andreas Mayr Lehrstuhl für Biometrie und Epidemiologie Wolfgang Uter Professur für Epidemiologie Olaf Gefeller Lehrstuhl für Biometrie und Epidemiologie

Involved external institutions

Rheinische Friedrich-Wilhelms-Universität Bonn

Germany (DE)

How to cite

APA:

Mayr, A., Schmid, M., Pfahlberg, A.B., Uter, W., & Gefeller, O. (2017). A permutation test to analyse systematic bias and random measurement errors of medical devices via boosting location and scale models. Statistical Methods in Medical Research, 26(3), 1443-1460. https://doi.org/10.1177/0962280215581855

MLA:

Mayr, Andreas, et al. "A permutation test to analyse systematic bias and random measurement errors of medical devices via boosting location and scale models." Statistical Methods in Medical Research 26.3 (2017): 1443-1460.

BibTeX: Download