Streckfusse N, Frey L, Zielonka G, Kroninger F, Ryzlewicz C, Ryssel H (1992)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 1992
Publisher: Springer-Verlag
Book Volume: 343
Pages Range: 765-768
DOI: 10.1007/BF00633562
APA:
Streckfusse, N., Frey, L., Zielonka, G., Kroninger, F., Ryzlewicz, C., & Ryssel, H. (1992). Analysis of trace metals on silicon surfaces. Fresenius Zeitschrift für Analytische Chemie, 343, 765-768. https://doi.org/10.1007/BF00633562
MLA:
Streckfusse, N., et al. "Analysis of trace metals on silicon surfaces." Fresenius Zeitschrift für Analytische Chemie 343 (1992): 765-768.
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