Continuous simulation of system-level automotive EMC problems
Neumayer R, Stelzer A, Haslinger F, Held J, Schinco F, Weigel R (2003)
Publication Type: Conference contribution
Publication year: 2003
Publisher: IEEE
Book Volume: 1
Pages Range: 409-413
Conference Proceedings Title: IEEE International Symposium on Electromagnetic Compatibility
Event location: Boston, USA
Abstract
Electromagnetic compatibility (EMC) issues are increasingly important to the automotive industry. Potential EMC problems arise from the growing use of electronic systems on the one hand and the lack of flexibility in placement or design of electronic modules on the other hand. In this paper we present a continuous EMC simulation process based on the exchange of EMC models between car manufacturer, electronic supplier and IC developer as applied to a general automotive application. The described process fundamentally influences the introduction of new technologies in automobiles by cutting the risk of EMC-failure and avoiding expensive and time-consuming redesigns.
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Austria (AT)How to cite
APA:
Neumayer, R., Stelzer, A., Haslinger, F., Held, J., Schinco, F., & Weigel, R. (2003). Continuous simulation of system-level automotive EMC problems. In IEEE International Symposium on Electromagnetic Compatibility (pp. 409-413). Boston, USA: IEEE.
MLA:
Neumayer, Roland, et al. "Continuous simulation of system-level automotive EMC problems." Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, Boston, USA IEEE, 2003. 409-413.
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