Built-in Self-Test für RFICs

Münker C, Weigel R (2006)

Publication Type: Conference contribution

Publication year: 2006

Conference Proceedings Title: EEEfCOM

Event location: Ulm, Germany

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik

How to cite

APA:

Münker, C., & Weigel, R. (2006). Built-in Self-Test für RFICs. In EEEfCOM. Ulm, Germany.

MLA:

Münker, Christian, and Robert Weigel. "Built-in Self-Test für RFICs." Proceedings of the EEEfCOM, Ulm, Germany 2006.

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