Thompson SM, Lazarov V, Bradley R, Deakin T, Kaeswurm B, Sterbinsky G, Cheng J, Wessels B (2010)
Publication Status: Published
Publication Type: Journal article
Publication year: 2010
Publisher: American Institute of Physics (AIP)
Book Volume: 107
Journal Issue: 9
DOI: 10.1063/1.3350911
The infrared magnetorefractive effect (MRE) is used to compare the magnetoresistance (MR) in epitaxial thin films of Fe3O4 grown on MgO with (100) and (111) crystal orientations. The smaller MRE detected in the (111) film is shown to correlate with the smaller electrically measured MR, its behavior consistent with a lower density of antiphase boundaries in the (111) film (C) 2010 American Institute of Physics. [doi:10.1063/1.3350911]
APA:
Thompson, S.M., Lazarov, V., Bradley, R., Deakin, T., Kaeswurm, B., Sterbinsky, G.,... Wessels, B. (2010). Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe3O4 films. Journal of Applied Physics, 107(9). https://dx.doi.org/10.1063/1.3350911
MLA:
Thompson, Sarah M., et al. "Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe3O4 films." Journal of Applied Physics 107.9 (2010).
BibTeX: Download