Su T, Unger M, Steinecke T, Weigel R (2008)
Publication Type: Conference contribution
Publication year: 2008
Pages Range: 1-4
Conference Proceedings Title: APEMC 2008 Asia-Pacific Symposium on Electromagnetic Compatibility
Event location: Singapore
This paper presents an approach to simulate the immunity of the microcontroller based on dynamic, nonlinear and passive model. By introducing the dynamic elements, this modelling technique reflects both those dynamic and nonlinear behaviour of ports and cores of the microcontroller. It can simulate not only external interference from outside but also the internal interference of the microcontroller itself. The dynamic model is suitable for time domain simulation. It is capable of simulating both RF and pulse immunity of the microcontroller.
APA:
Su, T., Unger, M., Steinecke, T., & Weigel, R. (2008). Dynamic, nonlinear and passive immunity model of microcontroller for time domain simulation. In APEMC 2008 Asia-Pacific Symposium on Electromagnetic Compatibility (pp. 1-4). Singapore.
MLA:
Su, Tao, et al. "Dynamic, nonlinear and passive immunity model of microcontroller for time domain simulation." Proceedings of the APEMC 2008 Asia-Pacific Symposium on Electromagnetic Compatibility, Singapore 2008. 1-4.
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