Homm D, Eckert J, German R (2015)
Publication Language: English
Publication Type: Book chapter / Article in edited volumes
Publication year: 2015
Publisher: Springer
Edited Volumes: Software Engineering and Formal Methods
Series: Lecture Notes in Computer Science
City/Town: Berlin Heidelberg
Book Volume: 9509
Pages Range: 22-31
Conference Proceedings Title: Software Engineering and Formal Methods
Event location: York, United Kingdom
ISBN: 978-3-662-49223-9
DOI: 10.1007/978-3-662-49224-6_3
Timed usage models (TUMs) represent a model-based statistical approach for system testing of real-time embedded systems. They enable an automatic test case generation and the calculation of parameters that aid the test process. However, a classical TUM only supports sequential uses of the system under test (SUT). It is not capable of dealing with concurrency, which is required for state of the art real-time embedded systems. Therefore, we introduce TUMs with parallel regions. They also allow automatic test case generation, which is carried out similarly to classical TUMs. But, the semi-Markov process (SMP) that usually used for analysis is not suitable here. We apply Markov renewal theory and define an SMP with parallel regions, which is used to calculate parameters. We validated our analytical approach by simulations.
APA:
Homm, D., Eckert, J., & German, R. (2015). Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems. In Springer (Eds.), Software Engineering and Formal Methods. (pp. 22-31). Berlin Heidelberg: Springer.
MLA:
Homm, Daniel, Jürgen Eckert, and Reinhard German. "Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems." Software Engineering and Formal Methods. Ed. Springer, Berlin Heidelberg: Springer, 2015. 22-31.
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