Engl M, Schiller K, Eurskens W, Weigel R (2006)
Publication Type: Conference contribution
Publication year: 2006
Pages Range: 7
Conference Proceedings Title: 56th Electronic Components and Technology Conference, 2006
Event location: San Diego, CA
DOI: 10.1109/ECTC.2006.1645817
We present a measurement setup for high resolution time domain and frequency domain package characterization. The measurement setup features a sub-mm spatial resolution, which enables accurate time domain measurements of actual small sized package types. We evaluate common calibration techniques and their suitability for package characterization in order to get most accurate measurement results. Further, we demonstrate the versatile utilization of time domain measurement techniques. Accurate impedance characterization and fault analysis of packages is achieved. In addition, we show frequency domain characterization of packages up to 65 GHz
APA:
Engl, M., Schiller, K., Eurskens, W., & Weigel, R. (2006). High Resolution Time Domain and Frequency Domain Package Characterization up to 65 GHz. In 56th Electronic Components and Technology Conference, 2006 (pp. 7). San Diego, CA.
MLA:
Engl, Mario, et al. "High Resolution Time Domain and Frequency Domain Package Characterization up to 65 GHz." Proceedings of the 56th Electronic Components and Technology Conference, 2006, San Diego, CA 2006. 7.
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