Seibert G, Metzner D, Klotz F, Pelz G, Weigel R (2006)
Publication Type: Conference contribution
Publication year: 2006
Pages Range: 356-358
Conference Proceedings Title: 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Event location: Singapore, SG
DOI: 10.1109/EMCZUR.2006.214944
Because of increasing the electronics in a car, the automotive industry researches for simulating the whole system and how each element could influence another unexpected element. These are often caused by conducted emissions, which are a major challenge in the simulation of automotive systems. One important task is modeling power-ICs to simulate the switching depending on the load. Although circuit based models could perform this task in principle, the required computing-resources for simulation exceed acceptable limits. The applicability of a highly abstracted model will be shown and correlated with measurements and circuit based simulation. This work is a part to find a way to develop a load-independent model for EMC-simulation, but also doesn't need to much simulation-time. This work has been funded by the "Bayerische Forschungsstiftung" project MISEA
APA:
Seibert, G., Metzner, D., Klotz, F., Pelz, G., & Weigel, R. (2006). Behavioral modelling of ICs for investigations of conducted emissions in automotive systems. In 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 (pp. 356-358). Singapore, SG.
MLA:
Seibert, Günter, et al. "Behavioral modelling of ICs for investigations of conducted emissions in automotive systems." Proceedings of the 17th International Zurich Symposium on Electromagnetic Compatibility, 2006, Singapore, SG 2006. 356-358.
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