A New BIST Scheme for the DAC SNDR Testing of an Audio Chip.

Li H, Eckmüller J, Russo M, Sattler S, Eichfeld H, Weigel R (2003)

Publication Type: Conference contribution

Publication year: 2003

Publisher: IEEE

Pages Range: 165-170

Conference Proceedings Title: 9th International Mixed-Signal Testing Workshop

Event location: Sevilla, Spain

Authors with CRIS profile

Sebastian Sattler Lehrstuhl für Zuverlässige Schaltungen und Systeme Robert Weigel Lehrstuhl für Technische Elektronik

How to cite

APA:

Li, H., Eckmüller, J., Russo, M., Sattler, S., Eichfeld, H., & Weigel, R. (2003). A New BIST Scheme for the DAC SNDR Testing of an Audio Chip. In 9th International Mixed-Signal Testing Workshop (pp. 165-170). Sevilla, Spain: IEEE.

MLA:

Li, Hongzhi, et al. "A New BIST Scheme for the DAC SNDR Testing of an Audio Chip." Proceedings of the 9th International Mixed-Signal Testing Workshop, Sevilla, Spain IEEE, 2003. 165-170.

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