Li H, Eckmüller J, Sattler S, Eichfeld H (2003)
Publication Type: Conference contribution
Publication year: 2003
Publisher: VDE ITG
Pages Range: 161-165
Conference Proceedings Title: ANALOG 2003
Event location: Heilbronn
ISBN: 978-3-8007-2778-0
A sine waveform signal generator for the on chip testing of mixed-signal circuits for speech processing is present. The idea behind is to attenuate the higher requencies in a periodic triangular waveform. The hardware implementation is discussed. And the simulation results validate our proposal. This generator can be employed for both the digital BIST and the analog/mixed-signal BIST applications with a verified DAC together.
APA:
Li, H., Eckmüller, J., Sattler, S., & Eichfeld, H. (2003). A Sine Waveform Generator for On-Chip Testing of the Audio Chip. In ANALOG 2003 (pp. 161-165). Heilbronn: VDE ITG.
MLA:
Li, Hongzhi, et al. "A Sine Waveform Generator for On-Chip Testing of the Audio Chip." Proceedings of the ANALOG 2003, Heilbronn VDE ITG, 2003. 161-165.
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