A novel test device to characterize SAW acoustomigration
Ruile W, Raml G, Springer A, Weigel R (2000)
Publication Type: Conference contribution
Publication year: 2000
Book Volume: 1
Pages Range: 275-278
Conference Proceedings Title: IEEE Ultrasonics Symposium 2000
Event location: San Juan, Puerto Rico
DOI: 10.1109/ULTSYM.2000.922555
Abstract
Acoustomigration is a well-known problem for SAW-filters used for front-end applications in modern mobile communications systems. Many different metallizations have been investigated so far to overcome this problem. Because of different test devices, testing conditions, and failure criteria it is difficult to compare and discuss the experimental results obtained by different research groups. Moreover, the electrical performance is changing during testing and thus the stress level in the metallization changes, too. In the present work, we propose a method to test metallizations independently of the influence of the SAW test device with defined and constant stressing of the metallization during the measurement campaigns. The device is a two-port resonator with a metallized area in the cavity. Migration patterns occur only in this fully metallized area whereas all electrodes remain unaffected. The irreversible shift of the resonance frequency due to acoustomigration can be evaluated as a function of temperature and input power during testing. Thus, the acoustomigration-related quality of different metallizations can be characterized in a well-defined manner
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APA:
Ruile, W., Raml, G., Springer, A., & Weigel, R. (2000). A novel test device to characterize SAW acoustomigration. In IEEE Ultrasonics Symposium 2000 (pp. 275-278). San Juan, Puerto Rico.
MLA:
Ruile, Werner, et al. "A novel test device to characterize SAW acoustomigration." Proceedings of the IEEE Ultrasonics Symposium 2000, San Juan, Puerto Rico 2000. 275-278.
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