Characterization of NIR-Lasers for Diode Laser Spectroscopy

Buchtal R, Engelbrecht R, Tröllsch A, Zinn P (2009)

Publication Type: Conference contribution

Publication year: 2009

Conference Proceedings Title: TDLS - 7th International Conference on Tuneable Diode Laser Spectroscopy, 13.-17.07.09, Zermatt, Schweiz

Authors with CRIS profile

Rainer Engelbrecht Lehrstuhl für Hochfrequenztechnik

Involved external institutions

Drägerwerk AG & Co. KGaA DE Germany (DE)

How to cite

APA:

Buchtal, R., Engelbrecht, R., Tröllsch, A., & Zinn, P. (2009). Characterization of NIR-Lasers for Diode Laser Spectroscopy. In TDLS - 7th International Conference on Tuneable Diode Laser Spectroscopy, 13.-17.07.09, Zermatt, Schweiz.

MLA:

Buchtal, R., et al. "Characterization of NIR-Lasers for Diode Laser Spectroscopy." Proceedings of the TDLS - 7th International Conference on Tuneable Diode Laser Spectroscopy, 13.-17.07.09, Zermatt, Schweiz 2009.

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