Münker C, Weigel R (2006)
Publication Type: Conference contribution
Publication year: 2006
Publisher: VDE Verlag GmbH
Conference Proceedings Title: ANALOG 2006 - 9. ITG/GMM-Fachtagung
Event location: Dresden, Germany
URI: http://www.vde-verlag.de/proceedings-en/442988034.html
A spectral built-in self test (BIST) solution for integrated cellular RF transmitters is presented that enables on-chip verification of PLL spectral performance. Multi-tone FM test signals with a spurious-free dynamic range (SFDR) of 60 dB are generated without compromising the performance of the RF transmitter itself. The RF signal is demodulated and digitized in an on-chip digital FM discriminator, spectral analysis is performed using digital narrowband filtering. The additional BIST blocks are fully digital and have been implemented on a chip area of only 0.05 mm2 in a 130 nm CMOS technology. The test blocks allow fast measurement of PLL frequency response, level of spurious sidebands and in-band phase noise down to -80 dBc without external test equipment. Catastrophic faults and most parametric faults can be detected as long as they influence the loop bandwidth or deteriorate spectral performance.
APA:
Münker, C., & Weigel, R. (2006). RF Built-In Self-Test for Integrated Cellular Transmitters. In ANALOG 2006 - 9. ITG/GMM-Fachtagung. Dresden, Germany: VDE Verlag GmbH.
MLA:
Münker, Christian, and Robert Weigel. "RF Built-In Self-Test for Integrated Cellular Transmitters." Proceedings of the ANALOG 2006 - 9. ITG/GMM-Fachtagung, Dresden, Germany VDE Verlag GmbH, 2006.
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