Lindlein N (2011)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2011
Book Volume: 8082
Article Number: 80821D
Event location: Munich
ISBN: 9780819486783
DOI: 10.1117/12.895004
A lateral shearing interferometer usually provides the slope data of a wave front under test along one direction. For the complete reconstruction of the wavefront, two slope datasets along different directions are required. Based on diffractive gratings, a simultaneous measurement of bothdata sets can be carried out. Two possible realizations are presented using a polarization signature and a partially coherent light source. © 2011 SPIE.
APA:
Lindlein, N. (2011). Diffractive simultaneous lateral shearing interferometry. In Proceedings of the Optical Measurement Systems for Industrial Inspection VII. Munich.
MLA:
Lindlein, Norbert. "Diffractive simultaneous lateral shearing interferometry." Proceedings of the Optical Measurement Systems for Industrial Inspection VII, Munich 2011.
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