Analytic noise-propagation in indirect fan-beam FBP reconstruction

Borsdorf A, Kappler S, Raupach R, Hornegger J (2008)


Publication Type: Conference contribution, Conference Contribution

Publication year: 2008

Journal

Original Authors: Borsdorf A., Kappler S., Raupach R., Hornegger J.

Book Volume: 2008

Pages Range: 2701-2704

Conference Proceedings Title: Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE

Event location: Vancouver, BC

Journal Issue: null

DOI: 10.1109/IEMBS.2008.4649759

Abstract

Precise knowledge of the local image noise is an essential ingredient to efficient application of post-processing methods such as wavelet or diffusion filtering to computed tomography (CT) images. The non-stationary, object dependent nature of noise in CT images is a direct result from the noise present in the projection data. Since quantum and electronics noise are the dominating noise sources, comparably simple models can be used for direct noise estimates in the individual projections. In this article, we describe the analytic propagation of these noise estimates through fan-beam filtered backprojection (FBP) reconstruction. Contrary to earlier publications in this field, we include the correlations within the parallel projections resulting from the rebinning, the convolution, and the backprojection processes. The method has been validated against Monte-Carlo results and good accuracy with an average relative error below 3.6% was achieved for arbitrary objects and over the full range of commonly used convolution kernels and field-of-view settings.

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How to cite

APA:

Borsdorf, A., Kappler, S., Raupach, R., & Hornegger, J. (2008). Analytic noise-propagation in indirect fan-beam FBP reconstruction. In Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE (pp. 2701-2704). Vancouver, BC.

MLA:

Borsdorf, Anja, et al. "Analytic noise-propagation in indirect fan-beam FBP reconstruction." Proceedings of the 30th Annual International Conference of the IEEE, Vancouver, BC 2008. 2701-2704.

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