Su T, Unger M, Steinecke T, Weigel R (2007)
Publication Type: Conference contribution
Publication year: 2007
Publisher: Infineon Technologies AG, Neubiberg
Pages Range: 1-6
Conference Proceedings Title: IEEE International Symposium on Electromagnetic Compatibility 2007
Event location: Honolulu, Hawaii
ISBN: 978-1-4244-1350-8
The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.
APA:
Su, T., Unger, M., Steinecke, T., & Weigel, R. (2007). New Test Method for the Pulse Immunity of Microcontrollers. In IEEE International Symposium on Electromagnetic Compatibility 2007 (pp. 1-6). Honolulu, Hawaii: Infineon Technologies AG, Neubiberg.
MLA:
Su, Tao, et al. "New Test Method for the Pulse Immunity of Microcontrollers." Proceedings of the IEEE International Symposium on Electromagnetic Compatibility 2007, Honolulu, Hawaii Infineon Technologies AG, Neubiberg, 2007. 1-6.
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