Ultra-wideband object characterization via A-scan

Oßberger G, Buchegger T, Pourvoyeur K, Schimbäck E, Stelzer A, Weigel R (2003)

Publication Type: Conference contribution

Publication year: 2003

Conference Proceedings Title: IEEE Conference on Ultra Wideband Systems and Technologies

Event location: Reston, VA, USA

DOI: 10.1109/UWBST.2003.1267888

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik

Involved external institutions

Johannes Kepler Universität (JKU) Linz AT Austria (AT)

How to cite

APA:

Oßberger, G., Buchegger, T., Pourvoyeur, K., Schimbäck, E., Stelzer, A., & Weigel, R. (2003). Ultra-wideband object characterization via A-scan. In IEEE Conference on Ultra Wideband Systems and Technologies. Reston, VA, USA.

MLA:

Oßberger, Gerald, et al. "Ultra-wideband object characterization via A-scan." Proceedings of the IEEE Conference on Ultra Wideband Systems and Technologies, Reston, VA, USA 2003.

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