Kissinger D, Nehring J, Bauch A, Borutta K, Nasr I, Lämmle B, Weigel R (2015)
Publication Type: Conference contribution
Publication year: 2015
Pages Range: 1-4
DOI: 10.1109/NEWCAS.2015.7181980
APA:
Kissinger, D., Nehring, J., Bauch, A., Borutta, K., Nasr, I., Lämmle, B., & Weigel, R. (2015). Integrated Test Concepts for In-Situ Millimeter-Wave Device Characterization. In Proceedings of the IEEE 13th International New Circuits and Systems Conference (NEWCAS) (pp. 1-4). Grenoble, FR.
MLA:
Kissinger, Dietmar, et al. "Integrated Test Concepts for In-Situ Millimeter-Wave Device Characterization." Proceedings of the IEEE 13th International New Circuits and Systems Conference (NEWCAS), Grenoble 2015. 1-4.
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