Rumler M, Rommel M, Erlekampf J, Azizi M, Geiger T, Bauer AJ, Meissner E, Frey L (2012)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2012
Publisher: American Institute of Physics Inc.
Book Volume: 112
Article Number: 034909
Journal Issue: 3
DOI: 10.1063/1.4746742
APA:
Rumler, M., Rommel, M., Erlekampf, J., Azizi, M., Geiger, T., Bauer, A.J.,... Frey, L. (2012). Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy. Journal of Applied Physics, 112(3). https://doi.org/10.1063/1.4746742
MLA:
Rumler, Maximilian, et al. "Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy." Journal of Applied Physics 112.3 (2012).
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