Lehrer C, Frey L, Petersen S, Ryssel H, Schäfer M, Sulzbach T (2004)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2004
Book Volume: 22
Pages Range: 1402-1406
Journal Issue: 3
URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-3242722353∨igin=inward
APA:
Lehrer, C., Frey, L., Petersen, S., Ryssel, H., Schäfer, M., & Sulzbach, T. (2004). Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams. Journal of Vacuum Science & Technology B, 22(3), 1402-1406.
MLA:
Lehrer, C., et al. "Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams." Journal of Vacuum Science & Technology B 22.3 (2004): 1402-1406.
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