Vetter A, Burlafinger K, Brabec C (2016)
Publication Language: English
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2016
Publisher: Springer Verlag
Book Volume: 98
Pages Range: 341-345
Journal Issue: 4
DOI: 10.1007/s00202-016-0418-x
Commercial success of optoelectronical devices such as solar cells depend strongly on lifetime next to production costs and power conversion efficiency. While a steep decrease in production costs and significant increase in efficiency have been achieved, lifetime still plays often a limiting factor, in particular, in case of highly innovative new device types. Lifetime tests measuring the stability of devices without external influences (i. p. water) generally take very long time due to the required long lifetime of optoelectronical devices. We established a novel accelerated lifetime test (ALT) setup which may increase the test speed by a factor of several hundred. We verified the setup and the applicability of our ALT measurement routine with an experiment on a well-studied innovative thin-film solar cell type (P3HT:PCBM).
APA:
Vetter, A., Burlafinger, K., & Brabec, C. (2016). Ultrafast screening method for assessing the photostability of thin-film solar cells. Electrical Engineering, 98(4), 341-345. https://doi.org/10.1007/s00202-016-0418-x
MLA:
Vetter, Andreas, Klaus Burlafinger, and Christoph Brabec. "Ultrafast screening method for assessing the photostability of thin-film solar cells." Electrical Engineering 98.4 (2016): 341-345.
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