Schießl A, Ahmed SS, Genghammer A, Schmidt LP (2013)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2013
Publisher: Institute of Electrical and Electronics Engineers
Edited Volumes: IEEE MTT-S International Microwave Symposium Digest
Conference Proceedings Title: IEEE International Microwave Symposium 2013
Event location: Seattle, USA
DOI: 10.1109/MWSYM.2013.6697783
Large multistatic mm-wave imaging systems have recently been developed and proved to be efficient for security applications. This work analyzes the effects caused by temperature changes on the imaging performance of a state-of-the-art system. The temperature dependent phase drift of a single measurement channel is characterized. A linearized model for the phase drifts in the RF channels is thus derived This model is applied to simulate for systematic phase drifts in the recorded raw data of the imaging system at different temperature profiles. Afterwards, images are reconstructed using modified raw data. Accordingly, the degradation in the imaging performance due to temperature changes is presented in terms of image quality and the associated point spread functions. © 2013 IEEE.
APA:
Schießl, A., Ahmed, S.S., Genghammer, A., & Schmidt, L.-P. (2013). Temperature Sensitivity of Large Digital-Beamforming Multistatic mm-Wave Imaging Systems. In IEEE International Microwave Symposium 2013. Seattle, USA: Institute of Electrical and Electronics Engineers.
MLA:
Schießl, Andreas, et al. "Temperature Sensitivity of Large Digital-Beamforming Multistatic mm-Wave Imaging Systems." Proceedings of the 2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013, Seattle, USA Institute of Electrical and Electronics Engineers, 2013.
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