Cenanovic A, Schmidt LP (2012)
Publication Type: Conference contribution
Publication year: 2012
Edited Volumes: 2012 IEEE International Conference on Wireless Information Technology and Systems, ICWITS 2012
Conference Proceedings Title: IEEE International Conference on Wireless Information Technology and Systems 2012
Event location: Maui, Hawaii, USA
DOI: 10.1109/ICWITS.2012.6417764
The combination of the reflection ellipsometry method with a polarimetric imaging system illustrated in Fig. 1(a) offers a promising approach for robust material characterization of dielectric samples from the phase difference of the (p) and (s) -polarized complex images R
APA:
Cenanovic, A., & Schmidt, L.-P. (2012). Sparse MIMO Array for Multi-Angle Reflection Ellipsometry. In IEEE International Conference on Wireless Information Technology and Systems 2012. Maui, Hawaii, USA.
MLA:
Cenanovic, Amir, and Lorenz-Peter Schmidt. "Sparse MIMO Array for Multi-Angle Reflection Ellipsometry." Proceedings of the 2012 IEEE International Conference on Wireless Information Technology and Systems, ICWITS 2012, Maui, Hawaii, USA 2012.
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