Alagöz I, Herpel T, German R (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Edited Volumes: Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
Pages Range: 114-125
Conference Proceedings Title: Software Testing, Verification and Validation (ICST), 2017 IEEE International Conference on
ISBN: 9781509060313
DOI: 10.1109/ICST.2017.18
APA:
Alagöz, I., Herpel, T., & German, R. (2017). A Selection Method for Black Box Regression Testing with a Statistically Defined Quality Level. In Software Testing, Verification and Validation (ICST), 2017 IEEE International Conference on (pp. 114-125). Institute of Electrical and Electronics Engineers Inc..
MLA:
Alagöz, Ibrahim, Thomas Herpel, and Reinhard German. "A Selection Method for Black Box Regression Testing with a Statistically Defined Quality Level." Proceedings of the 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 Institute of Electrical and Electronics Engineers Inc., 2017. 114-125.
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