Richter J, Hofmann A, Schmidt LP (2001)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2001
Publisher: IEEE Computer Society
Edited Volumes: 2001 31st European Microwave Conference, EuMC 2001
City/Town: London, UK
Book Volume: 1
Pages Range: 347-350
Conference Proceedings Title: Proceedings of the 31st European Microwave Conference
Event location: London
Various design procedures for millimeter-wave dielectric lenses have been studied and compared with regard to the wide angle characteristics of the resulting lens contours. The paper describes the simulation and optimisation of the focusing properties of the lenses for large scanning angles using a hybrid method involving ray-tracing techniques and aperture field integration, the realisation of unzoned and zoned lenses and the farfield pattern measurements at 75 and 150 GHz. The theoretical and experimental results show that a scanning range of 40° (±20°) with very low beam degradation can be achieved. © 2001 IEEE.
APA:
Richter, J., Hofmann, A., & Schmidt, L.-P. (2001). Dielectric Wide Angle Lenses for Millimeter-Wave Focal Plane Imaging. In Proceedings of the 31st European Microwave Conference (pp. 347-350). London: London, UK: IEEE Computer Society.
MLA:
Richter, Jürgen, Arnd Hofmann, and Lorenz-Peter Schmidt. "Dielectric Wide Angle Lenses for Millimeter-Wave Focal Plane Imaging." Proceedings of the 2001 31st European Microwave Conference, EuMC 2001, London London, UK: IEEE Computer Society, 2001. 347-350.
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