Munnecke A, Servais T (1996)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 1996
Publisher: Univerzita Karlova
Book Volume: 40
Pages Range: 549-553
URI: https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=3342920651&origin=inward
Scanning electron microscopy of polished, slightly etched rock
surfaces provides excellcnt observation conditions for
palynomorphs. ln the present study, samples from micritic Iimestone-
marl altemations in the Silurian of Gotland, Sweden, and
from Pliocene Iimestones of the Bahamas are used.
APA:
Munnecke, A., & Servais, T. (1996). Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ. Acta Universitatis Carolinae - Geologica, 40, 549-553.
MLA:
Munnecke, Axel, and Thomas Servais. "Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ." Acta Universitatis Carolinae - Geologica 40 (1996): 549-553.
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