A Fully Digital Method for the Generation of Sinusoidal Waveform for the Built-In Self-Test (BIST) of the Audio chip.

Li H, Eckmüller J, Sattler S, Eichfeld H, Weigel R (2003)

Publication Type: Conference contribution

Publication year: 2003

Publisher: VDE

Pages Range: 583-587

Conference Proceedings Title: 2nd VDE World Microtechnologies Congress

Event location: Munich, Germany

ISBN: 978-3-8007-2791-9

Authors with CRIS profile

Sebastian Sattler Lehrstuhl für Zuverlässige Schaltungen und Systeme Robert Weigel Lehrstuhl für Technische Elektronik

How to cite

APA:

Li, H., Eckmüller, J., Sattler, S., Eichfeld, H., & Weigel, R. (2003). A Fully Digital Method for the Generation of Sinusoidal Waveform for the Built-In Self-Test (BIST) of the Audio chip. In 2nd VDE World Microtechnologies Congress (pp. 583-587). Munich, Germany: VDE.

MLA:

Li, Hongzhi, et al. "A Fully Digital Method for the Generation of Sinusoidal Waveform for the Built-In Self-Test (BIST) of the Audio chip." Proceedings of the 2nd VDE World Microtechnologies Congress, Munich, Germany VDE, 2003. 583-587.

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