Bock F, Siegl S, German R (2017)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Edited Volumes: Proceedings - 43rd Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2017
Pages Range: 239-246
Conference Proceedings Title: 2017 43rd Euromicro Conference on Software Engineering and Advanced Applications (SEAA)
Event location: TU Wien - Campus Gusshausstrasse, Gusshausstrasse 25-29, 1040 Wien, Österreich
ISBN: 9781538621400
DOI: 10.1109/SEAA.2017.49
Modern driver assistance systems are often using a wide range of equipped sensors as primary data source. The reliability of each sensor is specified by the manufacturer and influences the system reliability distinctly. To prevent potential fatal system failures, diverse failure prevention mechanisms are included. Nevertheless, a certain level of reliability of the system has to be guaranteed to meet legal regulations. For this, extensive testing is required, which is costly due to the involved resources. To estimate and simulate the required test effort, an exact analytical method based on Markov Chains and an implementation realized in a common simulation framework is presented in this paper. It enables real automotive projects to estimate the test costs and simulate changes for various sensor setups.
APA:
Bock, F., Siegl, S., & German, R. (2017). Analytical Test Effort Estimation for Multisensor Driver Assistance Systems. In 2017 43rd Euromicro Conference on Software Engineering and Advanced Applications (SEAA) (pp. 239-246). TU Wien - Campus Gusshausstrasse, Gusshausstrasse 25-29, 1040 Wien, Österreich, AT: Institute of Electrical and Electronics Engineers Inc..
MLA:
Bock, Florian, Sebastian Siegl, and Reinhard German. "Analytical Test Effort Estimation for Multisensor Driver Assistance Systems." Proceedings of the 43rd Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2017, TU Wien - Campus Gusshausstrasse, Gusshausstrasse 25-29, 1040 Wien, Österreich Institute of Electrical and Electronics Engineers Inc., 2017. 239-246.
BibTeX: Download