Calculated and Measured Values of High-Dynamic Short-Circuit Stress in a High-Voltage Test Structure with and without Reclosure

Hosemann G, Tsanakas D (1979)

Publication Type: Journal article

Publication year: 1979

Journal

Electra Conference Internationale des Grands Reseaux Électriques à Haute Tension (CIGRE)

Book Volume: 63

Pages Range: 147-161

Additional Organisation(s)

Lehrstuhl für Elektrische Energiesysteme

How to cite

APA:

Hosemann, G., & Tsanakas, D. (1979). Calculated and Measured Values of High-Dynamic Short-Circuit Stress in a High-Voltage Test Structure with and without Reclosure. Electra, 63, 147-161.

MLA:

Hosemann, Gerhard, and Dimitris Tsanakas. "Calculated and Measured Values of High-Dynamic Short-Circuit Stress in a High-Voltage Test Structure with and without Reclosure." Electra 63 (1979): 147-161.

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