Münker C, Weigel R (2006)
Publication Type: Conference contribution
Publication year: 2006
Publisher: ITG/GMM
Conference Proceedings Title: ITG/GMM Workshop "Testmethoden und Zuverlässigkeit 2006" Titisee, Germany
URI: http://www.chipmuenk.de/papers/2006-ITG-Muenker-RF_BIST_Transmitters-Paper.pdf
A new approach to adding built-in self test (BIST) capabilities to integrated sigma-delta modulation RF transmitters is presented. An area efficient, all-digital building block generates multitone FM stimulus signals without compromising the performance of the RF transmitter itself. The RF signal is demodulated and digitized in a on-chip digital FM discriminator. Both blocks are fully testable using standard scan chain methods and consume a chip area of only 0.03 mm2 in a 130 nm CMOS technology. The spectral quality and reproducibility of the test signals are suitable for intermodulation distortion tests or PLL frequency response measurements.
APA:
Münker, C., & Weigel, R. (2006). RF Built-In Self-Test for Integrated Transmitters Using Sigma-Delta Techniques. In ITG/GMM Workshop "Testmethoden und Zuverlässigkeit 2006" Titisee, Germany. ITG/GMM.
MLA:
Münker, Christian, and Robert Weigel. "RF Built-In Self-Test for Integrated Transmitters Using Sigma-Delta Techniques." Proceedings of the ITG/GMM Workshop "Testmethoden und Zuverlässigkeit 2006" Titisee, Germany ITG/GMM, 2006.
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