Multiple-Wavelength Interferometry for Absolute Distance Measurement and Three-Dimentional Imaging

Leuchs G (2000)

Publication Type: Journal article

Publication year: 2000

Journal

Technisches Messen Oldenbourg Verlag

Book Volume: 67

Pages Range: 406

Journal Issue: 10

Authors with CRIS profile

Gerhard Leuchs Lehrstuhl für Experimentalphysik (Optik)

How to cite

APA:

Leuchs, G. (2000). Multiple-Wavelength Interferometry for Absolute Distance Measurement and Three-Dimentional Imaging. Technisches Messen, 67(10), 406.

MLA:

Leuchs, Gerd. "Multiple-Wavelength Interferometry for Absolute Distance Measurement and Three-Dimentional Imaging." Technisches Messen 67.10 (2000): 406.

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