Litz T, Fischer F, Lugauer HJ, Keim M, Zehnder U, Ossau W, Gerhard T, Gall R, Waag A, Landwehr G, Nagelstraßer M, Steinrück HP, Walter T, Gerthsen D (1998)
Publication Type: Journal article, Original article
Publication year: 1998
Original Authors: Litz M.Th., Fischer F., Lugauer H.-J., Keim M., Zehnder U., Ossau W., Gerhard Th., Gall R., Waag A., Landwehr G., Nagelstrasser M., Steinrück H.-P., Walter Th., Gerthsen D.
Publisher: Elsevier
Pages Range: 429-434
URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-0031703255&origin=inward
We report on the molecular beam epitaxy and the properties of Be-chalcogenides. Especially the interface between ZnSe and BeTe and BeTe/ZnSe superlattices have been studied by means of HRXRD (high resolution X-ray diffraction), HRTEM (high resolution transmission-electron-microscopy), RHEED (reflection-high-energy-electron-diffraction), photo-electron-spectroscopy (PES) and photo-luminescence (PL). A strong dependence of the structural and electronic properties of these superlattices (SL) on the interface configuration has been found. A high valence band offset of about 1 eV between BeTe and ZnSe has been determined by means of photo-luminescence and photo-electron-spectroscopy. © 1998 Elsevier Science B.V.
APA:
Litz, T., Fischer, F., Lugauer, H.-J., Keim, M., Zehnder, U., Ossau, W.,... Gerthsen, D. (1998). Be-chalcogenides: Heteroepitaxy and interface properties. Applied Surface Science, 429-434.
MLA:
Litz, T., et al. "Be-chalcogenides: Heteroepitaxy and interface properties." Applied Surface Science (1998): 429-434.
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