Neubauer R, Whelan C, Denecke R, Steinrück HP (2003)
Publication Type: Journal article
Publication year: 2003
Original Authors: Neubauer R., Whelan C.M., Denecke R., Steinrück H.-P.
Publisher: American Institute of Physics (AIP)
Book Volume: 119
Pages Range: 1710-1718
Journal Issue: 3
DOI: 10.1063/1.1582432
The thermal chemistry of saturated layers of acetylene and ethylene on Ni(100) was studied using in situ synchrotron x-ray photoelectron spectroscopy. The vibrational excitation of the C-H mode in gas phase ethylene was in the range of 410-420 meV, higher than the adsorbed states. It was concluded that the two peaks at 283.74 and 284.07 eV represented a single molecularly adsorbed ethylene species.
APA:
Neubauer, R., Whelan, C., Denecke, R., & Steinrück, H.-P. (2003). The thermal chemistry of saturated layers of acetylene and ethylene on Ni(100) studied by in situ synchrotron x-ray photoelectron spectroscopy. Journal of Chemical Physics, 119(3), 1710-1718. https://doi.org/10.1063/1.1582432
MLA:
Neubauer, Ralf, et al. "The thermal chemistry of saturated layers of acetylene and ethylene on Ni(100) studied by in situ synchrotron x-ray photoelectron spectroscopy." Journal of Chemical Physics 119.3 (2003): 1710-1718.
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