Tag A, Bader B, Pitschi M, Wagner KC, Weigel R, Hagelauer AM (2015)
Publication Type: Conference contribution
Publication year: 2015
Publisher: IEEE
Pages Range: 402-405
Conference Proceedings Title: German Microwave Conference
Event location: Nürnberg
DOI: 10.1109/GEMIC.2015.7107838
A new, accurate, and fast approach for determining the temperature coefficients of the thin film materials used in RF BAW components has been developed allowing the precise modeling of BAW components at different ambient temperatures. The presented method is based on the investigation of several resonance frequencies of the resonators with different layer-stacks. The problem of determining the temperature coefficients from broadband resonator simulations and measurements was formulated as an overdetermined linear system of equations and solved by using the weighted least square method. The presented approach has been verified by measurements.
APA:
Tag, A., Bader, B., Pitschi, M., Wagner, K.C., Weigel, R., & Hagelauer, A.M. (2015). Determination of Temperature Coefficients of Materials in RF BAW Resonators. In German Microwave Conference (pp. 402-405). Nürnberg: IEEE.
MLA:
Tag, Andreas, et al. "Determination of Temperature Coefficients of Materials in RF BAW Resonators." Proceedings of the German Microwave Conference (GeMiC), Nürnberg IEEE, 2015. 402-405.
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